• DocumentCode
    164796
  • Title

    Embedded SRAM and Cortex-M0 core with backup circuits using a 60-nm crystalline oxide semiconductor for power gating

  • Author

    Tamura, H. ; Kato, Kazuhiko ; Ishizu, Takahiko ; Onuki, Tatsuya ; Uesugi, Wataru ; Ohmaru, T. ; Ohshima, K. ; Kobayashi, Hideo ; Yoneda, Satoshi ; Isobe, Atsuo ; Tsutsui, Naoya ; Hondo, Suguru ; Suzuki, Yuya ; Okazaki, Yasuo ; Atsumi, T. ; Shionoiri, Y. ;

  • Author_Institution
    Semicond. Energy Lab. Co., Ltd., Atsugi, Japan
  • fYear
    2014
  • fDate
    14-16 April 2014
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    A chip of embedded SRAM having backup circuits using a 60-nm c-axis aligned crystalline oxide semiconductor (CAAC-OS) such as CAAC indium-gallium-zinc oxide (CAAC-IGZO) and Cortex-M0 core having flip-flops with CAAC-OS backup circuits is fabricated. The SRAM and M0 core can retain data using the backup circuits during power-off; thus, they can perform power gating (PG) with backup time of 100 ns and recovery time of 10 clock cycles (including data restoration time (100 ns)). Further, memory cell area and performance in combining a 45-nm Si SRAM memory cell with 60-nm CAAC-OS are estimated to have negligible overhead.
  • Keywords
    SRAM chips; gallium compounds; indium compounds; low-power electronics; microprocessor chips; Cortex-M0 core; InGaZnO; SRAM memory; backup circuits; crystalline oxide semiconductor; data restoration; embedded SRAM; flip-flops; power gating; size 45 nm; size 60 nm; Clocks; Flip-flops; Phasor measurement units; Random access memory; Silicon; System-on-chip; Transistors; CAAC-OS; Cortex-M0; embedded SRAM; overhead and SoC; power gating;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    COOL Chips XVII, 2014 IEEE
  • Conference_Location
    Yokohama
  • Type

    conf

  • DOI
    10.1109/CoolChips.2014.6842955
  • Filename
    6842955