DocumentCode
164796
Title
Embedded SRAM and Cortex-M0 core with backup circuits using a 60-nm crystalline oxide semiconductor for power gating
Author
Tamura, H. ; Kato, Kazuhiko ; Ishizu, Takahiko ; Onuki, Tatsuya ; Uesugi, Wataru ; Ohmaru, T. ; Ohshima, K. ; Kobayashi, Hideo ; Yoneda, Satoshi ; Isobe, Atsuo ; Tsutsui, Naoya ; Hondo, Suguru ; Suzuki, Yuya ; Okazaki, Yasuo ; Atsumi, T. ; Shionoiri, Y. ;
Author_Institution
Semicond. Energy Lab. Co., Ltd., Atsugi, Japan
fYear
2014
fDate
14-16 April 2014
Firstpage
1
Lastpage
3
Abstract
A chip of embedded SRAM having backup circuits using a 60-nm c-axis aligned crystalline oxide semiconductor (CAAC-OS) such as CAAC indium-gallium-zinc oxide (CAAC-IGZO) and Cortex-M0 core having flip-flops with CAAC-OS backup circuits is fabricated. The SRAM and M0 core can retain data using the backup circuits during power-off; thus, they can perform power gating (PG) with backup time of 100 ns and recovery time of 10 clock cycles (including data restoration time (100 ns)). Further, memory cell area and performance in combining a 45-nm Si SRAM memory cell with 60-nm CAAC-OS are estimated to have negligible overhead.
Keywords
SRAM chips; gallium compounds; indium compounds; low-power electronics; microprocessor chips; Cortex-M0 core; InGaZnO; SRAM memory; backup circuits; crystalline oxide semiconductor; data restoration; embedded SRAM; flip-flops; power gating; size 45 nm; size 60 nm; Clocks; Flip-flops; Phasor measurement units; Random access memory; Silicon; System-on-chip; Transistors; CAAC-OS; Cortex-M0; embedded SRAM; overhead and SoC; power gating;
fLanguage
English
Publisher
ieee
Conference_Titel
COOL Chips XVII, 2014 IEEE
Conference_Location
Yokohama
Type
conf
DOI
10.1109/CoolChips.2014.6842955
Filename
6842955
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