DocumentCode :
1649176
Title :
Phase fitting method for sub-pixel displacement measurements using digital speckle images
Author :
Zheng, Mai ; Ji, Jian ; Guo, Li ; Zhu, Junzhu
Author_Institution :
Dept. of Electron. Sci. & Technol., Univ. of Sci. & Technol. of China, Hefei
fYear :
2008
Firstpage :
26
Lastpage :
29
Abstract :
This paper presents a technique to measure the minute displacement using digital speckle images. We firstly de-noise the speckle images using wavelet transform. And then the phase correlation algorithm is employed to calculate the integer pixel displacement. To get the sub-pixel accuracy, we make use of the pixels around the highest phase impulse to construct a continuous surface. The final displacement is obtained by computing the regional extreme point of the surface function. In this way, we boost up the phase correlation and get the sub-pixel information without the time-consuming template matching as used in DSCM (Digital Speckle Correlation Method). We demonstrated the feasibility and effectiveness of our method on practical measuring results.
Keywords :
displacement measurement; image denoising; speckle; wavelet transforms; digital speckle correlation method; digital speckle images; displacement measurement; image denoising; integer pixel displacement; minute displacement; phase correlation; phase fitting; sub-pixel information; surface function; template matching; wavelet transforms; Adaptive optics; Correlation; Displacement measurement; Noise reduction; Optical distortion; Optical polarization; Optical scattering; Optical surface waves; Speckle; Surface emitting lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Signal Processing, 2008. ICSP 2008. 9th International Conference on
Conference_Location :
Beijing
Print_ISBN :
978-1-4244-2178-7
Electronic_ISBN :
978-1-4244-2179-4
Type :
conf
DOI :
10.1109/ICOSP.2008.4697060
Filename :
4697060
Link To Document :
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