DocumentCode :
1649454
Title :
MCM TEST USING AVAILABLE TECHNOLOGY
Author :
Keezer, D.C.
fYear :
1992
Firstpage :
253
Keywords :
Circuit testing; Conferences; Integrated circuit interconnections; Integrated circuit testing; Materials testing; Microelectronics; Multichip modules; Packaging; Probes; System testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1992. Proceedings., International
ISSN :
1089-3539
Print_ISBN :
0-7803-0760-7
Type :
conf
DOI :
10.1109/TEST.1992.527827
Filename :
527827
Link To Document :
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