مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1649454

Title :

MCM TEST USING AVAILABLE TECHNOLOGY

Author :

Keezer, D.C.

fYear :

1992

Firstpage :

253

Keywords :

Circuit testing; Conferences; Integrated circuit interconnections; Integrated circuit testing; Materials testing; Microelectronics; Multichip modules; Packaging; Probes; System testing;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Test Conference, 1992. Proceedings., International

ISSN :

1089-3539

Print_ISBN :

0-7803-0760-7

Type :

conf

DOI :

10.1109/TEST.1992.527827

Filename :

527827

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1649454