Title :
New analysis methods for comprehensive understanding of Random Telegraph Noise
Author :
Nagumo, T. ; Takeuchi, K. ; Yokogawa, S. ; Imai, K. ; Hayashi, Y.
Author_Institution :
LSI Fundamental Res. Lab., NEC Electron. Corp., Sagamihara, Japan
Abstract :
New analysis methods useful for understanding both complex waveforms and statistical behaviors of Random Telegraph Noise (RTN) are proposed. Complex waveforms are clearly visualized using Time Lag Plots. Bias dependence of statistically extracted average trap number is discussed, with emphasis on the importance of undetectable traps on product reliability.
Keywords :
delays; random noise; reliability; statistical analysis; telegraphy; complex waveforms; product reliability; random telegraph noise; statistical behaviors; statistically extracted average trap number; time lag plots; Current measurement; Fluctuations; Intrusion detection; Random access memory; Sampling methods; Statistical distributions; Switches; Telegraphy; Testing; Time measurement;
Conference_Titel :
Electron Devices Meeting (IEDM), 2009 IEEE International
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-5639-0
Electronic_ISBN :
978-1-4244-5640-6
DOI :
10.1109/IEDM.2009.5424230
