• DocumentCode
    165158
  • Title

    Microcontroller tracing in Hardware in the Loop tests integrating trace port measurement capability into NI VeriStand

  • Author

    Scherer, Balazs ; Horvath, Gabor

  • Author_Institution
    Dept. of Meas. & Inf. Syst., Budapest Univ. of Technol. & Econ., Budapest, Hungary
  • fYear
    2014
  • fDate
    28-30 May 2014
  • Firstpage
    522
  • Lastpage
    526
  • Abstract
    Developing software for safety critical embedded systems requires extensive testing, and HIL (Hardware in the Loop) test has one of the most important roles in this testing process. Modern microcontrollers can provide opportunities to improve the efficiency and capability of traditional HIL testing. Many of these opportunities are connected to their internal so called Trace interfaces. This paper shortly introduces the capabilities of these Trace interfaces, and presents the way to integrate them into a professional HIL test development environment the NI VeriStand. The integration process starts with the acquisition of Trace signals, which requires a high speed FPGA based solution, and then a way to capture and process the data at the VeriStand engine level (usually runs on a real-time target), and at the Workspace level (Host PC) is described. The paper ends with the conclusion, which analyzes the throughput and capabilities of the integrated Trace interface and shows the possible application of the data captured by it.
  • Keywords
    embedded systems; microcontrollers; program testing; safety-critical software; signal detection; user interfaces; HIL testing process; NI VeriStand; VeriStand engine level; data capture; data processing; hardware in the loop tests; high speed FPGA based solution; host PC; integrated trace interface; microcontroller tracing; professional HIL test development environment; safety critical embedded systems; trace port measurement capability; trace signal acquisition; workspace level; Decision support systems; ARM Cortex; CoreSight; HIL (Hardware-In-the-Loop) testing; LabVIEW; NI VeriStand; Trace;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control Conference (ICCC), 2014 15th International Carpathian
  • Conference_Location
    Velke Karlovice
  • Print_ISBN
    978-1-4799-3527-7
  • Type

    conf

  • DOI
    10.1109/CarpathianCC.2014.6843660
  • Filename
    6843660