Title :
Nanowire Addressing with Randomized-Contact Decoders
Author :
Rachlin, Eric ; Savage, John E.
Author_Institution :
Dept. of Comput. Sci., Brown Univ., Providence, RI
Abstract :
Methods for assembling crossbars from nanowires (NWs) have been designed and implemented. Methods for controlling individual NWs within a crossbar have also been proposed, but implementation remains a challenge. A NW decoder is a device that controls many NWs with a much smaller number of lithographically produced mesoscale wires (MWs). Unlike traditional demultiplexers, all proposed NW decoders are assembled stochastically. In a randomized-contact decoder (RCD) (Hogg et al., 2006), for example, field-effect transistors are randomly created at about half of the NW/MW junctions. In this paper, we tightly bound the number of MWs required to produce a correctly functioning RCD with high probability. We show that the number of MWs is logarithmic in the number of NWs, even when errors occur. We also analyze the overhead associated with controlling a stochastically assembled decoder. As we explain, lithographically-produced control circuitry must store information regarding which MWs control which NWs. This requires more area than the MWs themselves, but has received little attention elsewhere
Keywords :
assembling; lithography; nanotechnology; nanowires; crossbar assembly; field-effect transistors; lithographically-produced control circuitry; mesoscale wires; nanowire addressing; nanowires; randomized-contact decoder; randomized-contact decoders; stochastically assembled decoder; Assembly; Circuits; Decoding; Diodes; Logic arrays; Ohmic contacts; Permission; Programmable logic arrays; Voltage; Wires;
Conference_Titel :
Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
1-59593-389-1
Electronic_ISBN :
1092-3152
DOI :
10.1109/ICCAD.2006.320021