• DocumentCode
    1653121
  • Title

    Interconnect and delay testing with a 4800-pin board tester

  • Author

    Kameyama, Shuichi ; Ohara, Hideyuki ; Endo, Chihiro ; Takayama, Naoki

  • fYear
    1995
  • Firstpage
    338
  • Keywords
    Circuit testing; Clocks; Costs; Delay; Integrated circuit interconnections; Large-scale systems; Packaging; Probes; System testing; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527841
  • Filename
    527841
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1653121