DocumentCode :
1653888
Title :
Delay chain based programmable jitter generator
Author :
Tian Xia ; Peilin Song ; Jenkins, K.A. ; Jien-Chung Lo
Author_Institution :
Univ. of Vermont
fYear :
2004
Firstpage :
16
Lastpage :
21
Abstract :
In this paper, we presents a programmable jitter generator. Different from the traditional jitter generator that uses the analog phase modulation (PM) technique to generate only non-Gaussian distributed jitter components, the proposed jitter generator uses digital techniques. It consists of a voltage controlled delay chain, jitter control block, and some basic digital components. It can generate not only the non-Gaussian distributed jitter component, but also the Gaussiandistributed jitter component. In addition, almost all jitter characteristics are controllable. This jitter generator can be used in jitter tolerance test and jitter transfer function measurement. A Xilinx XC4010 FPGA chip is used to validate this design.
Keywords :
Automatic generation control; Circuit testing; Delay; Field programmable gate arrays; Phase modulation; Signal analysis; Signal generators; System testing; Timing jitter; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium, 2004. ETS 2004. Proceedings. Ninth IEEE European
Conference_Location :
Corsica, France
Print_ISBN :
0-7695-2119-3
Type :
conf
DOI :
10.1109/ETSYM.2004.1347578
Filename :
1347578
Link To Document :
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