DocumentCode
165656
Title
New approach for nanoindentation using multiprobe AFM system
Author
Cinar, E. ; Sahin, Ferat
Author_Institution
Microsyst. Eng. Dept., Rochester Inst. of Technol., Rochester, NY, USA
fYear
2014
fDate
18-21 Aug. 2014
Firstpage
49
Lastpage
53
Abstract
In nanoindentation, the accuracy of obtained data is highly depended on the limitations of the system that the measurements are performed with. In this paper for the first time in the literature, we present a new nanoindentation approach with a system that eliminates the major problems encountered with standard AFM or nanoindentation systems. We present the superior properties of our system and also discuss the current issues with standard systems. The end goal of this research work is to utilize the new approach for accurate mechanical characterization of soft materials which will be used in biological cell mechanics applications.
Keywords
atomic force microscopy; elastic moduli; materials testing; nanoindentation; accurate mechanical characterization; atomic force microscopy; biological cell mechanics; measurements; multiprobe AFM system; nanoindentation; soft materials; standard AFM; Diamonds; Force; Materials; Measurement by laser beam; Nanobioscience; Probes; Vibrations;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
Conference_Location
Toronto, ON
Type
conf
DOI
10.1109/NANO.2014.6968076
Filename
6968076
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