Title :
A capacitance meter based on an oversampling sigma-delta modulator and its application to capacitive sensor interface
Author :
Gallorini, R. ; Abouchi, N.
Author_Institution :
Lab. Image Signal et Acoustique, Ecoles Superieure de Chimie Phys. Electronique de Lyon, Villeurbanne, France
fDate :
6/23/1905 12:00:00 AM
Abstract :
A precision capacitance meter has been developed based on a switched-capacitor sigma delta analog-to-digital converter (ADC). It consists on a second order sigma delta architecture in which the capacitance to be measured takes part of the first integrator. A voltage reference is converted through the sigma delta ADC depending on the capacitance value. The whole operation is insensitive to stray capacitance and amplifier offset. For accurate requirements, calibration as well as temperature compensation have been integrated in the final chip
Keywords :
CMOS integrated circuits; calibration; capacitance measurement; capacitive sensors; compensation; integrating circuits; meters; sigma-delta modulation; switched capacitor networks; CMOS technology; SC sigma-delta ADC; analog-to-digital converter; calibration; capacitive sensor interface; integrator; oversampling sigma-delta modulator; precision capacitance meter; second order sigma delta architecture; switched-capacitor ADC; temperature compensation; voltage reference; Capacitance; Capacitive sensors; Circuit noise; Delta modulation; Delta-sigma modulation; Pulse width modulation; Signal to noise ratio; Switches; Transducers; Voltage;
Conference_Titel :
Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on
Print_ISBN :
0-7803-7057-0
DOI :
10.1109/ICECS.2001.957508