DocumentCode
165802
Title
Cross-sectional imaging of C. elegans by SEM-CT using Environmental SEM for nanomanipulation
Author
Nakajima, Masahiro ; Takeuchi, Masaru ; Hisamoto, Naoki ; Fukuda, Toshio ; Hasegawa, Yohei ; Qiang Huang
Author_Institution
Center For Micro-nano Mechatron., Nagoya Univ., Nagoya, Japan
fYear
2014
fDate
18-21 Aug. 2014
Firstpage
41
Lastpage
44
Abstract
A novel technique was presented for a cross-sectional imaging of Caenorhabditis elegans (C. elegans) by Scanning Electron Microscope - Computed Tomography (SEM-CT) using Environmental-SEM (E-SEM) for nanomanipulation applications. In our previous works, a nanorobotic manipulation system was established inside the E-SEM for water-contained samples including biological organism with a real-time high resolution observation. However, the SEM image is two dimensional (2D) and surficial information from the secondly electrons. Hence, it is not able to evaluate the targeted structure inside the sample. In this research, we presented the cross-sectional observation of the sample by SEM-CT system which is used the X-ray generated by the electron beam of SEM. To improve the signal-to-noise ratio of CT imaging, we evaluated the following ways, 1) apertures for X-ray before/after irradiating the sample, 2) adjustment of emission currents of the electron beam, 3) iteration processing of captured images. To reduce the damage of C. elegans during observation, a method was used to immerse the C. elegans by a liquid oil. The proposed 3D imaging technique is useful to evaluate the 3D manipulation of the C. elegans, such as nano-injection application with functional micro-nano beads inside the C. elegans.
Keywords
bioMEMS; computerised tomography; iterative methods; medical robotics; micromanipulators; nanobiotechnology; scanning electron microscopy; 3D imaging technique; 3D manipulation; C. elegans; CT imaging; Caenorhabditis elegans; E-SEM; SEM image; SEM-CT system; X-ray; apertures; biological organism; captured images; cross-sectional imaging; cross-sectional observation; electron beam; emission current adjustment; environmental SEM; environmental-SEM; functional micronano beads; iteration processing; liquid oil; nano-injection application; nanomanipulation applications; nanorobotic manipulation system; real-time high resolution observation; scanning electron microscope-computed tomography; signal-to-noise ratio; surficial information; targeted structure; two dimensional image; water-contained samples; Apertures; Electron beams; Nanobioscience; Scanning electron microscopy; X-ray imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanotechnology (IEEE-NANO), 2014 IEEE 14th International Conference on
Conference_Location
Toronto, ON
Type
conf
DOI
10.1109/NANO.2014.6968153
Filename
6968153
Link To Document