• DocumentCode
    1658043
  • Title

    Notice of Retraction
    Integrated quality and reliability solution based on Life Cycle Six Sigma

  • Author

    Wu, Jin Jei ; Wang, Y.Z. ; Zhou, C.Y. ; Shao, J.J.

  • Author_Institution
    Dept. of Mech. &Electr. Eng., Jiangxi Univ. of Sci. & Technol., Ganzhou, China
  • Volume
    3
  • fYear
    2010
  • Firstpage
    191
  • Lastpage
    195
  • Abstract
    Notice of Retraction

    After careful and considered review of the content of this paper by a duly constituted expert committee, this paper has been found to be in violation of IEEE´s Publication Principles.

    We hereby retract the content of this paper. Reasonable effort should be made to remove all past references to this paper.

    The presenting author of this paper has the option to appeal this decision by contacting TPII@ieee.org.

    Traditional Quality and Reliability Engineering often are separated, which cause lacks powerful methods and tools on the earlier development stage and takes high cost and long time. This paper proposes a new integrated quality and reliability methodology based on Life Cycle Six Sigma (LCSS) to assure product good quality, high reliability, low LCC, low price and short lead time simultaneously. A set of integrating methods and processes such as Q&R management, DOE, parameter design and tolerance design for product detailed design and optimization, HALT, HASS, SPC, CPK and Signal to Noise Ratio for product verification and manufacturing, Generalized FRACAS and eight Low-Cost Reliability Growth approaches are developed in this paper. Case studies suggest that these advanced process and technical methods will promote improvement and development of traditional reliability engineering to raise product core competitive power.
  • Keywords
    reliability; six sigma (quality); integrated quality; life cycle six sigma; parameter design; product manufacturing; product verification; reliability engineering; signal to noise ratio; tolerance design; Digital simulation; Gallium nitride; Manufacturing; Random access memory; Reliability engineering; Testing; Generalized FRACAS; HALT; Integrated Quality & Reliability engineering; Life Cycle Six Sigma; Robust Design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Advanced Management Science (ICAMS), 2010 IEEE International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-6931-4
  • Type

    conf

  • DOI
    10.1109/ICAMS.2010.5553257
  • Filename
    5553257