DocumentCode :
1659720
Title :
A new flash memory sense amplifier in 0.18 μm CMOS technology
Author :
Chrisanthopoulos, A. ; Moisiadis, Y. ; Varagis, A. ; Tsiatouhas, Y. ; Arapoyanni, A.
Author_Institution :
Adv. Silicon Solutions Div., Integrated Syst. Dev. S.A., Athens, Greece
Volume :
2
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
941
Abstract :
In this paper a new sense amplifier suitable for current sensing in EPROM, E2PROM and flash memories read operation is presented. The proposed sense amplifier provides fast response with low silicon area requirements that make it easily adaptable to the bit-line pitch. In this work simulation results are presented, in 0.18 μm CMOS technology, regarding the delay time versus different precharge voltages and bitline capacitance values, while worst case and high temperature simulations are included in order to expose limitations of the sensors in various operating conditions. Moreover, comparisons are given according to a conventional sensing scheme. Finally, a compact layout design is presented to illustrate the area efficiency of the proposed sense amplifier
Keywords :
CMOS memory circuits; EPROM; differential amplifiers; flash memories; integrated circuit layout; 0.18 micron; CMOS technology; EEPROM; EPROM; Si; bit-line capacitance values; bit-line pitch; compact layout design; current sensing; delay time; fast response; flash memory sense amplifier; high temperature simulations; low Si area requirements; memory read access path; precharge voltages; worst case simulations; CMOS technology; Capacitance; Delay effects; EPROM; Flash memory; Operational amplifiers; PROM; Silicon; Temperature sensors; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronics, Circuits and Systems, 2001. ICECS 2001. The 8th IEEE International Conference on
Print_ISBN :
0-7803-7057-0
Type :
conf
DOI :
10.1109/ICECS.2001.957628
Filename :
957628
Link To Document :
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