Title :
Testing of inter-word coupling faults in word-oriented SRAMs
Author :
Wang, X. ; Ottavi, M. ; Lombardi, F.
Author_Institution :
IBM Corp., Essex Junction, VT, USA
Abstract :
A new algorithm to detect inter-word coupling faults in word-organized SRAMs (WOMs) is proposed in this paper. This algorithm (referred to as March-NU) relies on a new fault model which extends fault detection to three additional types of coupling faults, i.e. read destructive, deceptive read destructive and incorrect read coupling faults. These faults are related to well known fault mechanisms, that have been reported in the literature, which occur in the read operation of SRAMs. Previous algorithms can not guarantee 100% fault detection of these coupling faults. March-NU sensitizes and detects with 100% coverage all coupling faults as well as traditional faults. A detailed analysis of its fault detection capabilities are presented. March-NU utilizes 8 March elements and its complexity is 30N, where N is the number of words in the WOM under test.
Keywords :
SRAM chips; integrated circuit testing; logic testing; March elements; March-NU fault detection algorithm; WOM; coupling fault testing; deceptive read destructive coupling faults; fault coverage; incorrect read coupling faults; inter-word coupling faults; word-organized SRAM; word-oriented SRAM; Bills of materials; Decoding; Fault detection; Fault diagnosis; Logic testing; Manufacturing processes; Pattern analysis; Random access memory; Read-write memory; SRAM chips;
Conference_Titel :
Defect and Fault Tolerance in VLSI Systems, 2004. DFT 2004. Proceedings. 19th IEEE International Symposium on
Print_ISBN :
0-7695-2241-6
DOI :
10.1109/DFTVS.2004.1347831
