• DocumentCode
    1661936
  • Title

    Robustsless Enhancement And Detection Threshold Reduction In ATPG For Gate Delay Faults

  • Author

    Mao, Weiwei ; Giletti, M.D.

  • fYear
    1992
  • Firstpage
    588
  • Keywords
    Automatic test pattern generation; Circuit faults; Circuit testing; Delay; Electrical fault detection; Fault detection; Logic testing; Robustness; Springs; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527879
  • Filename
    527879
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1661936