• DocumentCode
    1662057
  • Title

    Near field properties of monolayers of colloidal polystyrene microspheres on silicon

  • Author

    Huang, S.M. ; Wang, Z.A. ; Sun, Z. ; Wang, Z.B. ; Yanchuk, Boris Luk

  • Author_Institution
    Dept. of Phys., East China Normal Univ., Shanghai, China
  • fYear
    2010
  • Firstpage
    322
  • Lastpage
    323
  • Abstract
    We have investigated the optical resonance and near field effects of 2D periodic and absorptive polystyrene (PS) microspheres on Si wafers. The light scattering and coupling of neighbored PS spheres was numerically studied. Nanostructures were prepared on Si substrates using the regular 2D arrays by a single pulsed laser irradiation (KrF, ¿ = 248 nm). Periodical PS nanoparticle, PS nanoflowers and Si nanobumps were fabricated by different laser fluence. Mechanisms for PS particle size reduction and Si nanobump formation by laser irradiation were discussed on the base of the theoretical calculations. Good agreement between theoretical calculations and experimental results has been observed.
  • Keywords
    colloidal crystals; elemental semiconductors; krypton compounds; light scattering; monolayers; nanoparticles; silicon; substrates; 2D periodic microspheres; KrF; Si; absorptive polystyrene microspheres; colloidal polystyrene microspheres; light scattering; monolayers; nanobumps; nanoflowers; nanoparticles; nanostructured materials; near field effects; optical resonance; particle size reduction; regular 2D arrays; silicon wafers; single pulsed laser irradiation; substrates; wavelength 248 nm; Atomic force microscopy; Data engineering; High speed optical techniques; Laser theory; Nanostructures; Optical films; Optical scattering; Optical sensors; Scanning electron microscopy; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424718
  • Filename
    5424718