• DocumentCode
    1662262
  • Title

    High purity separation of nanoparticle dimers and trimers for SERS hot spots

  • Author

    Chen, Gang ; Wang, Yong ; Yang, Miaoxin ; Tan, Li Huey ; Chen, Hongyu

  • Author_Institution
    Div. of Chem. & Biol. Chem., Nanyang Technol. Univ., Singapore, Singapore
  • fYear
    2010
  • Firstpage
    328
  • Lastpage
    329
  • Abstract
    Here, we report the ensemble-averaged measurement of SERS hot spots EF from spatially isolated colloidal nanoclusters. This approach was achieved by well-defined Au@Ag core-shell NP dimers and trimers-the simplest structure to investigate SERS hot spots phenomenon. These hot spots units with similar nature were made up of uniform Au@Ag NPs attached by a close-paking Raman reporter monolayer, then stabilized by polymer encapsulation and enriched to high purity by differential centrifugation. To our knowledge this study is the most approximate description of SERS hot spots nanostructures for colloidal ensemble-averaged EF measurement. The calculated averaged EFs are 5.6×103 for monomer and 0.7×106 for hot spot in dimer. It indicated the SERS intensity of the molecule in gap region is higher than that in the outside region by factor of 125.
  • Keywords
    colloidal crystals; encapsulation; gold; nanoparticles; nanotechnology; polymers; separation; silver; surface enhanced Raman scattering; Au-Ag; SERS hot spots nanostructures; close-paking Raman reporter monolayer; colloidal ensemble; colloidal nanoclusters; differential centrifugation; ensemble-averaged measurement; nanoparticle dimers; nanoparticle trimers; polymer encapsulation; purity separation; Bars; Chemistry; Electromagnetic coupling; Electromagnetic fields; Encapsulation; Fabrication; Nanobioscience; Nanostructures; Polymers; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanoelectronics Conference (INEC), 2010 3rd International
  • Conference_Location
    Hong Kong
  • Print_ISBN
    978-1-4244-3543-2
  • Electronic_ISBN
    978-1-4244-3544-9
  • Type

    conf

  • DOI
    10.1109/INEC.2010.5424723
  • Filename
    5424723