DocumentCode
1662724
Title
A Testing Technique for ULSI Memory with On-chip Voltage Down Converter
Author
Tsukude, M. ; Arimoto, Keisuke ; Hidaka, Hideto ; Konishi, Yasuo ; Hayashikoshi, Masanori
fYear
1992
Firstpage
615
Keywords
Circuit testing; Differential amplifiers; Fluctuations; Fuses; Laser tuning; Stress; Temperature dependence; Tunable circuits and devices; Ultra large scale integration; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1992. Proceedings., International
ISSN
1089-3539
Print_ISBN
0-7803-0760-7
Type
conf
DOI
10.1109/TEST.1992.527882
Filename
527882
Link To Document