Title :
Quality improvement methods for system-level stimuli generation
Author :
Emek, Roy ; Jaeger, Itai ; Katz, Yoav ; Naveh, Yehuda
Author_Institution :
IBM Res. Lab., Haifa Univ., Israel
Abstract :
Functional verification of systems is aimed at validating the integration of previously verified components. It deals with complex designs, and invariably suffers from scarce resources. We present a set of methods, collectively known as testing knowledge, aimed at increasing the quality of automatically generated system-level test-cases. Testing knowledge reduces the time and effort required to achieve high coverage of the verified design.
Keywords :
automatic test pattern generation; formal verification; automatically generated system level test; functional verification; quality improvement methods; system level stimuli generation; testing knowledge; Automatic testing; Bridges; Computer bugs; Engines; Hardware; Laboratories; System testing; Test pattern generators; Vehicles;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on
Print_ISBN :
0-7695-2231-9
DOI :
10.1109/ICCD.2004.1347923