• DocumentCode
    1663011
  • Title

    A Self-Testing and Self-Repairing Structure for Ultra-Large Capacity Memories

  • Author

    Chen, Tom ; Sunada, Glen

  • fYear
    1992
  • Firstpage
    623
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Costs; Logic testing; Performance evaluation; Production; Semiconductor device testing; Test equipment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527883
  • Filename
    527883
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1663011