• DocumentCode
    1663160
  • Title

    Multiple input bridging fault detection in CMOS sequential circuits

  • Author

    Jha, Niraj K. ; Wang, S.-J. ; Gripka, Phillip C.

  • Author_Institution
    Dept. of Electr. Eng., Princeton Univ., NJ, USA
  • fYear
    1992
  • Firstpage
    369
  • Lastpage
    372
  • Abstract
    Bridging fault testing algorithms for CMOS sequential circuits, assuming current supply monitoring, are discussed. Sequential circuits implemented both with and without scan design are considered. Experimental results are given to show the efficacy of the methods
  • Keywords
    CMOS integrated circuits; fault location; logic testing; sequential circuits; CMOS sequential circuits; current supply monitoring; fault testing algorithms; multiple input bridging fault detection; scan design; Circuit faults; Circuit testing; Current supplies; Electrical fault detection; Fault detection; Logic testing; Monitoring; Sequential analysis; Sequential circuits; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 1992. ICCD '92. Proceedings, IEEE 1992 International Conference on
  • Conference_Location
    Cambridge, MA
  • Print_ISBN
    0-8186-3110-4
  • Type

    conf

  • DOI
    10.1109/ICCD.1992.276291
  • Filename
    276291
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1663160