DocumentCode :
1663562
Title :
Resonator surface contamination-a cause of frequency fluctuations?
Author :
Yong, Y.K. ; Vig, John R.
Author_Institution :
Dept. of Civil & Environ. Eng., Rutgers Univ., Piscataway, NJ, USA
fYear :
1988
Firstpage :
397
Lastpage :
403
Abstract :
The mass loading effects of adsorbing and desorbing contaminant molecules on the magnitude and characteristics of frequency fluctuations are studied in a thickness shear resonator. An equation was derived relating the spectral density of frequency fluctuations to: rates of adsorption and desorption of one species of contaminant molecules; mass per unit area of a monolayer of molecules; frequency constant; thickness of resonator; and number of molecular sites on one resonator surface. The induced phase noises were found to be significant in very high frequency resonators and are not simple functions of the percent area contaminated. The spectral density of frequency fluctuations was inversely proportional to the fourth power of the thickness if other parameters were held constant. Since the resonator frequency is inversely proportional to the thickness, the spectral density is, in effect, proportional to the fourth power of resonator frequency
Keywords :
adsorption; crystal resonators; desorption; electron device noise; frequency stability; adsorption; contaminant molecules; desorption; electron device noise; frequency constant; frequency fluctuations; mass loading effects; molecular sites; monolayer of molecules; phase noises; resonator frequency; resonator surface contamination; spectral density; thickness; thickness shear resonator; Acoustic noise; Circuit noise; Dynamic equilibrium; Electrodes; Fluctuations; Frequency estimation; Steady-state; Surface contamination; Temperature; Vibrations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location :
Baltimore, MD
Type :
conf
DOI :
10.1109/FREQ.1988.27631
Filename :
27631
Link To Document :
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