Title :
Applicability of artificial intelligence languages to solving the scattering and diffraction problems using a personal computer
Author :
Jha, R.M. ; Bokhari, S.A. ; Sudhakar, V. ; Mahapatra, P.R.
Author_Institution :
Dept. of Aerosp. Eng., Indian Inst. of Sci., Bangalore, India
Abstract :
The applicability of AI (artificial intelligence) mathematical software packages to EM (electromagnetic) theory is examined using high-frequency ray-theoretic problems as specific examples. It is possible to generate expressions in both readable and FORTRAN format so that the task of computer code generation is greatly simplified. Although some of the mathematical operations available have a limited range, the users can nevertheless employ such packages to cross-check their mathematical analyses. In the high-frequency ray-theoretic approach, as indeed in the entire field of electromagnetics, the expressions obtained at each step of the mathematical analysis are often quite complex and unwieldy. It is now possible to consign most of these operations to such AI packages as REDUCE to generate the symbolic codes accurately. Finally, once the analysis has been verified, the same program can be used to generate the familiar FORTRAN codes. Hence, nonnumeric logic and AI languages can be used as valuable tools for antenna analysis and design problems.<>
Keywords :
artificial intelligence; electromagnetic wave diffraction; electromagnetic wave scattering; microcomputer applications; software packages; telecommunications computing; AI languages; EM waves; FORTRAN; REDUCE; antenna analysis; artificial intelligence; computer code generation; design; diffraction; electrical engineering computing; mathematical analyses; nonnumeric logic; personal computer; scattering; software packages; Artificial intelligence; Diffraction; Equations; Frequency; Knowledge based systems; Logic programming; Mathematical analysis; Packaging; Scattering; Software packages;
Conference_Titel :
Antennas and Propagation Society International Symposium, 1989. AP-S. Digest
Conference_Location :
San Jose, CA, USA
DOI :
10.1109/APS.1989.134795