• DocumentCode
    1663608
  • Title

    Static transition probability analysis under uncertainty

  • Author

    Garg, Siddharth ; Tata, Siddharth ; Arunachalam, Ravishankar

  • Author_Institution
    Dept. of Electr. Eng., Indian Inst. of Technol., Chennai, India
  • fYear
    2004
  • Firstpage
    380
  • Lastpage
    386
  • Abstract
    Deterministic gate delay models have been widely used to find the transition probabilities at the nodes of a circuit for calculating the power dissipation. However, with progressive scaling down of feature sizes, the variations in process parameters increase, thereby increasing the uncertainty in gate delay. In this work, we propose a novel non-simulative scheme to compute the transition probability waveforms (TPWs) in a single pass of the circuit for continuous gate delay distributions. These TPWs are continuous functions of time as opposed to the deterministic delay case where transitions are constrained to occur at discrete time points. The TPWs are then used to calculate the dynamic power dissipation in a circuit. We show that the corresponding power estimates obtained from deterministic delay models can be off by as much as 75%. Our method has an average error of only 6% and a speed up of 232× when compared to logic simulations. Another important application of our TPWs is in the area of crosstalk noise where the likelihood of signals switching within a certain timing window is required.
  • Keywords
    crosstalk; logic gates; statistical distributions; continuous gate delay distributions; crosstalk noise; deterministic gate delay models; power dissipation; static transition probability analysis; transition probability waveforms; Circuit simulation; Crosstalk; Delay effects; Delay estimation; Distributed computing; Logic; Power dissipation; Probability; Propagation delay; Uncertainty;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Design: VLSI in Computers and Processors, 2004. ICCD 2004. Proceedings. IEEE International Conference on
  • ISSN
    1063-6404
  • Print_ISBN
    0-7695-2231-9
  • Type

    conf

  • DOI
    10.1109/ICCD.2004.1347950
  • Filename
    1347950