• DocumentCode
    1663827
  • Title

    High Quality Testing of Embedded RAMs Using Circular Self-Test Path

  • Author

    Krasniewski, Andrzej ; Pilarski, Slawomir

  • fYear
    1992
  • Firstpage
    652
  • Keywords
    Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Flip-flops; Programmable logic arrays; Random access memory; Read-write memory; Registers; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527886
  • Filename
    527886
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1663827