Title :
Experimental results on aging of AT-cut strip resonators
Author :
Gehrke, J.R. ; Klawitter, R.
Author_Institution :
Motorola Inc., Franklin Park, IL, USA
Abstract :
The results of experiments designed to determine the primary causes of aging in AT-cut strip resonators operating in the thickness-shear model of vibration are described. Accelerated aging at temperatures 125°C and above showed an initial positive frequency shift of short duration followed by a dominant negative shift. A series of experiments were conducted to establish the mechanism(s) which caused this type of aging. The rate of negative aging was observed to be dependent on the type of conductive epoxy used
Keywords :
ageing; crystal resonators; life testing; 125 C; AT-cut strip resonators; accelerated ageing; conductive epoxy; crystal resonator; dominant negative shift; positive frequency shift; thickness-shear model; Accelerated aging; Crystals; Frequency; Glass; Packaging; Pollution measurement; Stress; Strips; Temperature control; Temperature dependence;
Conference_Titel :
Frequency Control Symposium, 1988., Proceedings of the 42nd Annual
Conference_Location :
Baltimore, MD
DOI :
10.1109/FREQ.1988.27633
