DocumentCode :
1665757
Title :
A digital calibration technique for pipelined analog-to-digital converters
Author :
Furuta, Masanori ; Kawahito, Shoji ; Miyazaki, Daisuke
Author_Institution :
Graduate Sch. of Electron. Sci. & Technol., Shizuoka Univ., Japan
Volume :
1
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
713
Abstract :
A digital calibration technique, which corrects errors due to capacitor mismatch and charge injection in pipelined ADC and directly measures the error coefficient using the ADC INL plot, is described. The proposed technique can be applied for various types of pipelined ADC architectures. Test results using an implemented 10-bit pipelined ADC show that the ADC achieves a peak signal-to-noise-and-distortion ratio of 56.6 dB, a peak integral nonlinearity of 0.3 LSB, and a peak differential nonlinearity of 0.3 LSB using the digital calibration.
Keywords :
analogue-digital conversion; calibration; charge injection; error correction; pipeline processing; CMOS technology; S/H stage; capacitor mismatch; charge injection; digital calibration technique; error analysis model; error measurement; factory calibration; flow chart; gain errors; interstage amplifiers; lump signal generation; offset errors; parallel pipelined ADC; peak differential nonlinearity; peak integral nonlinearity; Analog-digital conversion; CMOS technology; Calibration; Capacitors; Charge measurement; Circuits; Current measurement; Energy consumption; Error correction; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
ISSN :
1091-5281
Print_ISBN :
0-7803-7218-2
Type :
conf
DOI :
10.1109/IMTC.2002.1006929
Filename :
1006929
Link To Document :
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