DocumentCode :
1666022
Title :
A 28Gb/s 4-tap FFE/15-tap DFE serial link transceiver in 32nm SOI CMOS technology
Author :
Bulzacchelli, John ; Beukema, Troy ; Storaska, Daniel ; Hsieh, Ping-Hsuan ; Rylov, Sergey ; Furrer, Daniel ; Gardellini, Daniele ; Prati, Andrea ; Menolfi, Christian ; Hanson, David ; Hertle, Juergen ; Morf, Thomas ; Sharma, Vivek ; Kelkar, Ram ; Ainspan,
Author_Institution :
IBM Res., Yorktown Heights, NY, USA
fYear :
2012
Firstpage :
324
Lastpage :
326
Abstract :
As exemplified by standards such as OIF CEI-25G, 32G-FC, and next-generation 100GbE, serial link data rates are being pushed up to 25 to 28Gb/s in order to increase I/O system bandwidth. Such speeds represent a near doubling of the state-of-the-art for fully integrated transceivers [1-3]. With scaling no longer providing large gains in device speed, significant design advances must be made to attain these data rates. This paper describes a 28Gb/s serial link transceiver featuring a source-series terminated (SST) driver topology with twice the speed of existing designs, a two-stage peaking amplifier with capacitively-coupled parallel input stages and active feedback, and a 15-tap DFE. The use of capacitive level-shifters allows a single current-integrating summer to drive the parallel paths used for speculating the first two DFE taps.
Keywords :
CMOS analogue integrated circuits; amplifiers; circuit feedback; driver circuits; network topology; silicon-on-insulator; transceivers; 4-tap FFE-15-tap DFE serial link transceiver; I/O system bandwidth; SOI CMOS technology; SST driver topology; active feedback; bit rate 28 Gbit/s; capacitive level-shifter; capacitively-coupled parallel input stage; current-integrating summer; device speed; fully integrated transceiver; parallel path; serial link data rate; size 32 nm; source-series terminated driver topology; two-stage peaking amplifier; CMOS integrated circuits; Capacitors; Clocks; Couplings; Decision feedback equalizers; Phase locked loops; Transceivers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2012 IEEE International
Conference_Location :
San Francisco, CA
ISSN :
0193-6530
Print_ISBN :
978-1-4673-0376-7
Type :
conf
DOI :
10.1109/ISSCC.2012.6177031
Filename :
6177031
Link To Document :
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