• DocumentCode
    1666413
  • Title

    Design for Testability Using Architectural Descriptions

  • Author

    Chickermane, Vivek ; Lee, Jaushin ; Patel, Janak H.

  • fYear
    1992
  • Firstpage
    752
  • Keywords
    Algorithm design and analysis; Circuit faults; Circuit testing; Counting circuits; Data mining; Design for testability; Flip-flops; High performance computing; Sequential circuits; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527897
  • Filename
    527897
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1666413