• DocumentCode
    166734
  • Title

    Non-EOS root causes of EOS-like damage

  • Author

    Righter, Alan ; Wolfe, Ed ; Hajjar, Jean-Jacques

  • Author_Institution
    Analog Devices, Wilmington, MA, USA
  • fYear
    2014
  • fDate
    7-12 Sept. 2014
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Failures resembling damage from electrical overstress (EOS) may not always have their root cause related to a direct EOS transient. The authors describe examples from packaging, manufacturing and test where the damage signature was EOS although the root cause was non-EOS in origin. Containment and/or resolution in each case is reviewed.
  • Keywords
    electrostatic discharge; failure analysis; EOS-like damage; ESD; damage signature; direct EOS transient; electrical overstress; failure resembling damage; nonEOS root causes; Capacitors; Delamination; Earth Observing System; Integrated circuits; Materials; Microassembly; Pins;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
  • Conference_Location
    Tucson, AZ
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6968802
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=166734