• DocumentCode
    166789
  • Title

    Practical transient system-level ESD modeling - Environment contribution

  • Author

    Beges, Remi ; Caignet, Fabrice ; Durier, Andre ; Marot, Christian ; Bafleur, Marise ; Nolhier, Nicolas

  • Author_Institution
    LAAS, Toulouse, France
  • fYear
    2014
  • fDate
    7-12 Sept. 2014
  • Firstpage
    1
  • Lastpage
    10
  • Abstract
    A methodology for building a transient model of an analog system is detailed. It does not require proprietary knowledge for integrated circuits (IC). At IC level, it combines a protection structure characterization and behavioral modeling with a core description. A specific test board is developed with a smart voltage regulator to validate the methodology. A system model is assembled to perform powered-on transient ESD simulations. A soft-failure criterion is chosen and the prediction of trends in soft-failure generation is carried out. The strong influence of the electrical environment is demonstrated through this case study.
  • Keywords
    electrostatic discharge; failure analysis; integrated circuit modelling; integrated circuit technology; integrated circuit testing; transient analysis; voltage regulators; IC level; analog system; behavioral modeling; integrated circuits; powered-on transient ESD simulations; protection structure characterization; soft-failure criterion; soft-failure generation; test board; transient system-level ESD modeling; voltage regulator; Capacitors; Electrostatic discharges; Integrated circuit modeling; Numerical models; Stress; Voltage control;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
  • Conference_Location
    Tucson, AZ
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6968830