DocumentCode :
166789
Title :
Practical transient system-level ESD modeling - Environment contribution
Author :
Beges, Remi ; Caignet, Fabrice ; Durier, Andre ; Marot, Christian ; Bafleur, Marise ; Nolhier, Nicolas
Author_Institution :
LAAS, Toulouse, France
fYear :
2014
fDate :
7-12 Sept. 2014
Firstpage :
1
Lastpage :
10
Abstract :
A methodology for building a transient model of an analog system is detailed. It does not require proprietary knowledge for integrated circuits (IC). At IC level, it combines a protection structure characterization and behavioral modeling with a core description. A specific test board is developed with a smart voltage regulator to validate the methodology. A system model is assembled to perform powered-on transient ESD simulations. A soft-failure criterion is chosen and the prediction of trends in soft-failure generation is carried out. The strong influence of the electrical environment is demonstrated through this case study.
Keywords :
electrostatic discharge; failure analysis; integrated circuit modelling; integrated circuit technology; integrated circuit testing; transient analysis; voltage regulators; IC level; analog system; behavioral modeling; integrated circuits; powered-on transient ESD simulations; protection structure characterization; soft-failure criterion; soft-failure generation; test board; transient system-level ESD modeling; voltage regulator; Capacitors; Electrostatic discharges; Integrated circuit modeling; Numerical models; Stress; Voltage control;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
Conference_Location :
Tucson, AZ
ISSN :
0739-5159
Type :
conf
Filename :
6968830
Link To Document :
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