DocumentCode
1668083
Title
In-vacuum resonant tunneling in the nanopentode
Author
Blackburn, A.M. ; Hasko, D.G. ; Williams, D.A.
Author_Institution
Hitachi Cambridge Lab., Hitachi Eur. Ltd., Cambridge, UK
fYear
2005
Firstpage
180
Lastpage
181
Abstract
Nanopentode device fabrication process and predicted characteristics are presented. The fabrication process involves a combination of reaction ion etching and wet etching. The fabricated device structure makes it possible to simultaneously create an in-vacuum potential-energy barrier and well, creating a gaseous-state device similar in some respects to the solid-state resonant tunneling diode. The calculated transmission probability for electrons through the entire cathode-anode gap, in a one-dimensional approximation, shows resonances at certain gate-voltage arrangement. This strengthens the possibility of observing quantum interference effects in multiple-gate vacuum microelectronic devices.
Keywords
anodes; cathodes; etching; nanoelectronics; quantum interference devices; resonant tunnelling; resonant tunnelling devices; vacuum microelectronics; cathode-anode gap; device fabrication; device structure; electron transmission probability; gaseous-state device; gate-voltage arrangement; in-vacuum potential-energy barrier; in-vacuum potential-energy well; in-vacuum resonant tunneling; multiple-gate vacuum microelectronic devices; nanopentode; one-dimensional approximation; quantum interference effects; reaction ion etching; solid-state resonant tunneling diode; wet etching; Diodes; Electrons; Elementary particle vacuum; Fabrication; Nanoscale devices; Probability; Resonance; Resonant tunneling devices; Solid state circuits; Wet etching;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Nanoelectronics Conference, 2005. IVNC 2005. Technical Digest of the 18th International
Print_ISBN
0-7803-8397-4
Type
conf
DOI
10.1109/IVNC.2005.1619545
Filename
1619545
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