Characterization of planar passive circuits using source method

Author

Grayaa, Kbaled ; Aguili, Taoufik ; Bouallegue, Ammar

Author_Institution

Lab. des Syst. et Telecommun., Ecole Nat. d´´Ingenieurs de Tunis, Tunisia

fYear

1998

fDate

6/20/1905 12:00:00 AM

Firstpage

131

Lastpage

134

Abstract

A source method is developed for analysing STEP and GAP discontinuities in microstrip circuits. We propose to model the circuit by a rigorous method. including sources and using roof top trial functions. The roof top expansion functions approach is largely developed in the literature for complex discontinuities. Nevertheless, this approach generates a large matrix system. The numerical results obtained, giving the transmission coefficients for the STEP and GAP discontinuities, are compared with previously published data

Keywords

Galerkin method; boundary-value problems; current density; microstrip circuits; microstrip discontinuities; passive networks; transmission line matrix methods; GAP discontinuities; Galerkin method; STEP discontinuities; boundary conditions; full wave method; impedance matrix; large matrix system; microstrip circuits; planar passive circuits; roof top trial functions; source method; transmission coefficients; Boundary conditions; Current density; Dielectric substrates; H infinity control; Impedance; Metallization; Microstrip filters; Microwave integrated circuits; Passive circuits; Transmission line matrix methods;

fLanguage

English

Publisher

ieee

Conference_Titel

Microelectronics, 1998. ICM '98. Proceedings of the Tenth International Conference on

Conference_Location

Monastir

Print_ISBN

0-7803-4969-5

Type

conf

DOI

10.1109/ICM.1998.825586

Filename

825586