• DocumentCode
    166835
  • Title

    Identification of two-probe TLP contact resistance issues and proposed solutions

  • Author

    Liang Wang ; Rajagopal, Karthikeyan ; Kunz, Hans ; Concannon, Ann ; Brodsky, Jonathan

  • Author_Institution
    Analog Technol. Dev., Texas Instrum. Inc., Dallas, TX, USA
  • fYear
    2014
  • fDate
    7-12 Sept. 2014
  • Firstpage
    1
  • Lastpage
    9
  • Abstract
    Inaccurate and unrepeatable TLP results have been obtained with a two-probe (2P) wafer-level system. This work identifies three distinct issues associated with probe contact resistance, which negatively impact TLP measurements. Two different solutions, Kelvin TLP and an improvement to 2P TLP measurements, are proposed and their pros and cons are discussed.
  • Keywords
    contact resistance; electrostatic discharge; 2P TLP measurements; 2P wafer-level system; Kelvin TLP; on-chip electrostatic discharge; transmission line pulsing; two-probe TLP contact resistance identification; two-probe wafer-level system; Calibration; Contact resistance; Electrical resistance measurement; Electrostatic discharges; Probes; Resistance; Stress;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD), 2014 36th
  • Conference_Location
    Tucson, AZ
  • ISSN
    0739-5159
  • Type

    conf

  • Filename
    6968855
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=166835