DocumentCode
1670176
Title
Design of embedded metrology subsystem for intelligent sensing
Author
Kochan, R. ; Sachenko, A. ; Daponte, P. ; Sobolev, V. ; Kochan, V.
Author_Institution
Inst. of Comput. Inf. Technol., Temopil, Ukraine
Volume
2
fYear
2002
fDate
6/24/1905 12:00:00 AM
Firstpage
1171
Abstract
The structure and operating algorithms are synthesizing using the requirements to the embedded system of metrology support. The results of the experimental researches using the metrology software tests are presented in this paper. The experimental researches are presented for K-type thermocouple.
Keywords
intelligent sensors; thermocouples; ISIS; K-type thermocouple; embedded subsystem; intelligent sensor; metrology software test; metrology support; operating algorithm; Calibration; Embedded system; Error correction; Instruments; Intelligent structures; Intersymbol interference; Mathematical model; Metrology; Sensor phenomena and characterization; Sensor systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 2002. IMTC/2002. Proceedings of the 19th IEEE
ISSN
1091-5281
Print_ISBN
0-7803-7218-2
Type
conf
DOI
10.1109/IMTC.2002.1007123
Filename
1007123
Link To Document