Title :
Synthesis and characterization of highly ordered TiO2 nanotube arrays
Author :
Sun, Kao-Chen ; Chen, Mu-Tze ; Shiu, Bo-Yun ; Lu, Yung-Fang ; Chung, Jen-Chieh ; Liu, Yu-Chang ; Zeng, Yu-Zhen ; Wang, Hong-Wen
Author_Institution :
Dept. of Chem., Chung-Yuan Christian Univ., Chungli, Taiwan
Abstract :
Highly-ordered TiO2 nanotube arrays (TNA) by anodizing Ti foil were carried out using a slightly modified electrochemical process. The parameters such as anodization potentials and duration have been varied in order to fabricate the specific length and diameter of TNA. The morphologies of TNA were characterized by field emission scanning electron microscope (Hitachi S-4100 FE-SEM). The crystalline phase and structure were analyzed using X-ray diffraction (Rigaku, XRD). The processing anodic current density with time was recorded by Keithley 2400. The photocurrents induced by UV-light were characterized by CHI 611. The performance of hydrogen production from photoelectrocatalytic effect of larger diameter TNA is found to be higher than the smaller diameter TNA. Base on the microstructure and calculation, we confirmed that larger diameter TNA do exhibit higher surface area.
Keywords :
X-ray diffraction; anodisation; catalysis; crystal microstructure; crystal structure; current density; electrochemistry; nanotubes; photochemistry; photoemission; scanning electron microscopy; titanium compounds; ultraviolet radiation effects; Hitachi S-4100 FE-SEM; Keithley 2400; Ti foil anodization; TiO2; UV-light; X-ray diffraction; anodic current density; anodization potentials; crystalline phase; crystalline structure; electrochemical process; field emission scanning electron microscope; highly ordered nanotube arrays; hydrogen production; microstructure; photocurrents; photoelectrocatalytic effect; surface area; Crystallization; Current density; Electrochemical processes; Electron emission; Hydrogen; Morphology; Photoconductivity; Scanning electron microscopy; X-ray diffraction; X-ray scattering;
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
DOI :
10.1109/INEC.2010.5425056
