DocumentCode
1671920
Title
Influence of nickel nanoparticle-substitution on dielectric properties of P(BN)ZT ceramics
Author
Jaitanong, Nittaya ; Vittayakorn, Wanwilai C. ; Chaipanich, Arnon
Author_Institution
Dept. of Phys. & Mater. Sci., Chiang Mai Univ., Chiang Mai, Thailand
fYear
2010
Firstpage
551
Lastpage
552
Abstract
In the present study, the effect of nickel nanoparticle doping on the dielectric properties of lead bismuth niobate zirconate titanate, P(BN)ZT solid solution were investigated. P(BN)ZT powder doped with nickel in the composition of (1-x) PBNZT-xNi when x = 0.00, 0.02, 0.04, 0.06, 0.08 and 0.1 percent by mole. P(BN)ZT doped with nickel powder were calcined at 900°C for 2 h and sintered at the temperature range of 1150-1250°C for 2 h with heating/cooling rate of 5°C/min. The dielectric constant ( ¿r) of all ceramics was measured at room temperature using LCR meter. The domain structure was observed by piezoresponse force microscopy (PFM). From the results, it can be seen that properties of P(BN)ZT ceramics with doped nickel nanoparticle change significantly with increasing nickel additive content in the system.
Keywords
bismuth compounds; calcination; ceramics; doping; lead compounds; nanoparticles; nickel; niobium compounds; permittivity; powders; sintering; solid solutions; zirconium compounds; PbBiNbO3ZrO3TiO3:Ni; calcination; ceramics; dielectric constant; dielectric properties; lead bismuth niobate zirconate titanate; nickel nanoparticle doping; nickel nanoparticle substitution; nickel powder; piezoresponse force microscopy; sintering; solid solution; temperature 1150 degC to 1250 degC; temperature 293 K to 298 K; temperature 900 degC; time 2 h; Bismuth; Ceramics; Dielectrics; Doping; Nickel; Niobium compounds; Powders; Solids; Temperature measurement; Titanium compounds;
fLanguage
English
Publisher
ieee
Conference_Titel
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location
Hong Kong
Print_ISBN
978-1-4244-3543-2
Electronic_ISBN
978-1-4244-3544-9
Type
conf
DOI
10.1109/INEC.2010.5425081
Filename
5425081
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