Title :
A linear-logarithmic CMOS sensor with offset calibration using an injected charge signal
Author :
Hara, Kunihiko ; Kubo, Hiroshi ; Kimura, Masatoshi ; Murao, Fumihide ; Komori, Shinji
Author_Institution :
Renesas Technol., Itami, Japan
Abstract :
A combined linear and logarithmic image sensor is implemented in a 0.35 μm 1P3M technology. The pixel is 7.5×7.5 μm2 with a 37% fill factor and contains only 4 transistors. Offset calibration in the logarithmic region is realized by using electrical charge injection into the photodiode. The sensor achieves 120 dB DR and the offset calibration reduces the FPN from 13 mV to 5 mV.
Keywords :
CMOS image sensors; calibration; integrated circuit design; integrated circuit measurement; integrated circuit noise; photodiodes; 0.35 micron; 13 mV; 5 mV; 7.5 micron; FPN; combined linear and logarithmic image sensor; fill factor; injected charge signal; linear-logarithmic CMOS sensor; logarithmic region offset calibration; offset calibration; photodiode electrical charge injection; pixel size; sensor DR; Analog memory; CMOS image sensors; CMOS technology; Calibration; Circuits; Image sensors; Photodiodes; Pixel; Sensor phenomena and characterization; Tellurium;
Conference_Titel :
Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8904-2
DOI :
10.1109/ISSCC.2005.1494015
