DocumentCode :
1672683
Title :
Photoresponse characteristics of vertically aligned ZnO nanowires
Author :
Kar, J.P. ; Das, S.N. ; Choi, J.H. ; Lee, T.I. ; Myoung, J.M.
Author_Institution :
Dept. of Mater. Sci. & Eng., Yonsei Univ., Seoul, South Korea
fYear :
2010
Firstpage :
951
Lastpage :
952
Abstract :
In this study, vertically aligned ZnO nanowires were grown by metal organic chemical vapor deposition (MOCVD) method. The growth direction of vertically aligned nanowires was along c-axis. For monolithic integration, vertically aligned ZnO nanowires were grown on AlN/Si substrates with a higher aspect ratio in comparison to those on bare silicon substrates. In a separate experiment, micro-patterning of the nanowires was obtained by lift-off technique, where BaF2 film was used as a sacrificial layer. ZnO nanowires based UV detectors were fabricated using silicon microchannel. Nanowires with higher aspect ratio exhibited the highest on-off current ratio and less photoresponse time.
Keywords :
II-VI semiconductors; III-V semiconductors; MOCVD coatings; aluminium compounds; elemental semiconductors; microfabrication; nanowires; photodetectors; semiconductor growth; semiconductor quantum wires; semiconductor thin films; silicon; ultraviolet detectors; wide band gap semiconductors; zinc compounds; AlN; MOCVD; Si; UV detectors; ZnO-AlN; ZnO-Si; aluminium nitride-silicon substrates; film; growth direction; lift-off technique; metal organic chemical vapor deposition method; micropatterning; monolithic integration; on-off current ratio; photoresponse; sacrificial layer; separate experiment; silicon microchannel; vertically aligned nanowires; Chemical vapor deposition; Detectors; MOCVD; Microchannel; Monolithic integrated circuits; Nanowires; Organic chemicals; Silicon; Substrates; Zinc oxide;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanoelectronics Conference (INEC), 2010 3rd International
Conference_Location :
Hong Kong
Print_ISBN :
978-1-4244-3543-2
Electronic_ISBN :
978-1-4244-3544-9
Type :
conf
DOI :
10.1109/INEC.2010.5425109
Filename :
5425109
Link To Document :
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