DocumentCode

1672736

Title

ENHANCED PROBE CARD FACILITATES AT-SPEED WAFER PROBING IN VERY HIGH DENSITY APPLICATIONS

Author

Subramanian, Eswar ; Nelson, Randy

fYear

1992

Firstpage

936

Keywords

Biomembranes; Blades; Capacitance; Crosstalk; Frequency; Impedance; Inductance; Probes; Testing; Wire;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 1992. Proceedings., International

ISSN

1089-3539

Print_ISBN

0-7803-0760-7

Type

conf

DOI

10.1109/TEST.1992.527920

Filename

527920