• DocumentCode
    1673014
  • Title

    A 3 GHZ, 144 point probe future for automatic IC wafer testing

  • Author

    Hamling, Daniel T.

  • fYear
    1995
  • Firstpage
    940
  • Abstract
    A probe fixture for manufacturing has been developed that addresses the need for high speed automatic wafer testing of medium to high pad count ICs. The probe fixture enhibits a bandwidth of 3.2 GHz and a maximum probe count of 144 as well as other useful capabilities. The probe fixture and test system description, perfomance capabilities, and practical demonstration are discussed.
  • Keywords
    Automatic testing; Bandwidth; Circuit testing; Clamps; Fixtures; High speed integrated circuits; Integrated circuit testing; Manufacturing automation; Probes; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1992. Proceedings., International
  • Conference_Location
    Baltimore, MD
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-0760-7
  • Type

    conf

  • DOI
    10.1109/TEST.1992.527921
  • Filename
    527921
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1673014