Title :
A programmable on-chip picosecond jitter-measurement circuit without a reference-clock input
Author :
Ishida, M. ; Ichiyama, K. ; Yamaguchi, T.J. ; Soma, M. ; Suda, M. ; Okayasu, T. ; Watanabe, D. ; Yamamoto, K.
Author_Institution :
Advantest, Gunma, Japan
Abstract :
An on-chip jitter measurement circuit in 0.18 μm CMOS is demonstrated, using a combination of a programmable delay line, interleaving PFD, and programmable charge pumps. The method does not require a reference clock. Interleaving PFD minimizes bias errors. Measurement linearity is 3.5 μV/ps with an error of 1.03psrms for a 2GHz clock.
Keywords :
CMOS integrated circuits; clocks; delay lines; microprocessor chips; programmable circuits; timing jitter; 0.18 mm; 2 GHz; CMOS; bias error minimization; interleaving PFD; measurement linearity; picosecond jitter measurement; programmable charge pumps; programmable delay line; programmable on-chip circuit; Charge measurement; Charge pumps; Circuits; Clocks; Current measurement; Delay lines; Interleaved codes; Jitter; Linearity; Phase frequency detector;
Conference_Titel :
Solid-State Circuits Conference, 2005. Digest of Technical Papers. ISSCC. 2005 IEEE International
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-8904-2
DOI :
10.1109/ISSCC.2005.1494094
