• DocumentCode
    167724
  • Title

    Extraction of determinants of postoperative length of stay from operation records

  • Author

    Yamashita, Takayoshi ; Wakata, Yoshifumi ; Nakashima, Norihiro ; Hirokawa, Sachio ; Hamai, Satoshi ; Nakashima, Yuta ; Iwamoto, Yukihide

  • Author_Institution
    Med. Inf. Center, Kyushu Univ. Hosp., Fukuoka, Japan
  • fYear
    2014
  • fDate
    8-9 May 2014
  • Firstpage
    822
  • Lastpage
    827
  • Abstract
    Secondary use of clinical text data are gaining much attention in improving the quality and the efficiency of medical treatment. Although there is some case studies of medical-examination text data, there are not many examples fed back to the medical-examination spot. The present paper analyses the operation records of total hip arthroplasty. We extracted feature words that characterize the two peaks which appeared in distribution of postoperative hospital days using SVM (support vector machine) and FS (feature selection). The models gained by optimal FS attained 60% accuracy as prediction performance. We applied logistic regression analysis to estimate postoperative length of stay from the extracted feature words. Most words were not statistically significant except two words.
  • Keywords
    feature extraction; feature selection; hospitals; medical computing; patient treatment; regression analysis; support vector machines; FS; SVM; clinical text data; determinant extraction; feature selection; feature word extraction; logistic regression analysis; medical treatment; medical-examination text data; operation records; postoperative hospital days distribution; postoperative stay length; support vector machine; total hip arthroplasty; Adaptive optics; Analytical models; Biomedical optical imaging; Hospitals; Indexes; Predictive models; Surgery; CI(crithical indicator); SVM; critical path way; hip replacement arthroplasty; logistic regression analysis; operation record;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Computer and Applications, 2014 IEEE Workshop on
  • Conference_Location
    Ottawa, ON
  • Type

    conf

  • DOI
    10.1109/IWECA.2014.6845748
  • Filename
    6845748