Title :
A Low-Cost FPGA-Based Test and Diagnosis Architecture for SRAMs
Author :
Di Carlo, S. ; Prinetto, Paolo ; Scionti, Alberto ; Figueras, Joan ; Manich, Salvador ; Rodriguez-Montañés, Rosa
Author_Institution :
Control & Comput. Eng. Dept., Politec. di Torino, Torino, Italy
Abstract :
The continues improvement of manufacturing technologies allows the realization of integrated circuits containing an ever increasing number of transistors. A major part of these devices is devoted to realize SRAM blocks. Test and diagnosis of SRAM circuits are therefore an important challenge for improving quality of next generation integrated circuits. This paper proposes a flexible platform for testing and diagnosis of SRAM circuits. The architecture is based on the use of a low cost FPGA based board allowing high diagnosability while keeping costs at a very low level.
Keywords :
SRAM chips; field programmable gate arrays; logic testing; SRAM circuit diagnosis architecture; low-cost FPGA-based testing; next-generation integrated circuits; Circuit faults; Circuit testing; Computer aided manufacturing; Costs; Fault diagnosis; Field programmable gate arrays; Integrated circuit testing; Microprocessors; SRAM chips; System testing; March Test; Memory Diagnosis; Memory Testing;
Conference_Titel :
Advances in System Testing and Validation Lifecycle, 2009. VALID '09. First International Conference on
Conference_Location :
Porto
Print_ISBN :
978-1-4244-4862-3
Electronic_ISBN :
978-0-7695-3774-0
DOI :
10.1109/VALID.2009.29
