DocumentCode :
1678026
Title :
Statistical and topological characterization of PD defects
Author :
Paithankar, Amit A. ; Mokashi, A.D. ; Singh, N.M.
Author_Institution :
ABB Lenzohm Service Ltd., Mumbai, India
fYear :
1999
fDate :
6/21/1905 12:00:00 AM
Firstpage :
517
Lastpage :
521
Abstract :
The dynamic evolution of partial discharges (PDs) is nonlinear and chaotic in nature. This means that although a PD has a definite governing principle which dictates its evolution, it may behave in an apparently random manner due the existence of nonlinearity. Analyzing the PD process entails considering a PD as a dynamical system. As the PD process evolves, it marks a trajectory in the state-space which is attracted to a specific region. This region of the the state-space is called the attractor. Distinct PD defects have distinct dynamics of evolution which result in a unique structure for PD attractors. In this paper, two methods of characterizing PD attractors are discussed. The first method relates to the statistical or the metric characterization of the PD attractor which attempts to describe the structure of the attractor in metric terms. The topological characterization aims at evaluating the topological invariants of the system, which describe the geometry of the attractor
Keywords :
insulation; partial discharges; state-space methods; statistical analysis; attractor geometry; dynamic evolution; dynamical system; nonlinearity; partial discharges; state-space trajectory; statistical characterization; topological characterization; Chaos; Corona; Dielectrics and electrical insulation; Fault location; Geometry; Nonlinear dynamical systems; Partial discharges; Power transformer insulation; State-space methods; Surface discharges;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation Conference and Electrical Manufacturing & Coil Winding Conference, 1999. Proceedings
Conference_Location :
Cincinnati, OH
ISSN :
0362-2479
Print_ISBN :
0-7803-5757-4
Type :
conf
DOI :
10.1109/EEIC.1999.826264
Filename :
826264
Link To Document :
بازگشت