DocumentCode
16782
Title
Constructing Sub-Arrays with ShortInterconnects from Degradable VLSI Arrays
Author
Wu Jigang ; Srikanthan, Thambipillai ; Guiyuan Jiang ; Kai Wang
Author_Institution
Sch. of Comput. Sci. & Software Eng., Tianjin Polytech. Univ., Tianjin, China
Volume
25
Issue
4
fYear
2014
fDate
Apr-14
Firstpage
929
Lastpage
938
Abstract
Reducing the interconnection length of VLSI arrays leads to less capacitance, power dissipation and dynamic communication cost between the processing elements (PEs). This paper develops efficient algorithms for constructing tightly-coupled subarrays from the mesh-connected VLSI arrays with faulty PEs. For a given size r·s of the target (logical) array, the proposed algorithm searches and reroutes a physical r×s subarray that has the least number of faults, resulting in an approximate target array, which is subsequently extended to the desired target array. Experimental results show that over 65 percent redundant interconnects can be reduced for a 64×64 target array on the 512×512 host array with no more than 1 percent faults. In addition, we propose a recursive divide-and-conquer algorithm for constructing the maximum target array (MTA). The lower bound of the total interconnection length of the MTA has been established. Experimental results show that the proposed algorithm is capable of reducing the long interconnects by over 33 percent for the MTA derived from the 512×512 host array with no more than 1 percent faults. Moreover, the proposed total interconnection length of target array is close to the lower bound for the cases with relatively fewer number of faults.
Keywords
VLSI; directed graphs; divide and conquer methods; fault tolerant computing; MTA; VLSI interconnection length; capacitance; degradable VLSI arrays; dynamic communication cost; faulty PE; maximum target array; mesh-connected VLSI arrays; power dissipation; processing elements; recursive divide-and-conquer algorithm; redundant interconnects; tightly-coupled subarrays; very large scale integrated circuits; Circuit faults; Computer architecture; Fault tolerance; Fault tolerant systems; Logic arrays; Switches; Very large scale integration; Reconfiguration; algorithm; degradable VLSI array; fault tolerance; routing;
fLanguage
English
Journal_Title
Parallel and Distributed Systems, IEEE Transactions on
Publisher
ieee
ISSN
1045-9219
Type
jour
DOI
10.1109/TPDS.2013.114
Filename
6497050
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