• DocumentCode
    1679558
  • Title

    Nonlinear model for predicting intermodulation distortion in GaAs FET RF switch devices

  • Author

    Pla, J.A. ; Struble, W.

  • Author_Institution
    Raytheon Co., Lexington, MA, USA
  • fYear
    1993
  • Firstpage
    641
  • Abstract
    A nonlinear model for predicting IMD (intermodulation distortion) in GaAs FET RF switch devices has been developed. A novel unified equivalent circuit model of the switch FET for the ON and the OFF states has been proposed. The nonlinearities of the test FET as a function of the gate bias were identified and modeled up to 40 GHz by fitting scattering parameter data. These nonlinearities were combined into a single nonlinear model constructed from a number of elementary linear and nonlinear elements. The nonlinear circuit equations were incorporated as a user-defined model in LIBRA to perform the harmonic balance technique. This model has been used to predict the IMD and phase shifting performance of three of the individual bit chips (11.25, 22.5, and 180 degrees ) of a 6-18-GHz wideband 5-b phase shifter. In this phase shifter, GaAs MESFETs are used as switch devices which configure the bits into high- or low-pass filter structures.<>
  • Keywords
    III-V semiconductors; S-parameters; Schottky gate field effect transistors; circuit analysis computing; electric distortion; equivalent circuits; field effect transistors; gallium arsenide; intermodulation; semiconductor device models; semiconductor switches; solid-state microwave devices; 40 GHz; 6 to 18 GHz; FET RF switch devices; GaAs; IMD; LIBRA; MESFETs; harmonic balance technique; intermodulation distortion; nonlinear model; nonlinearities; phase shifting performance; scattering parameter data; unified equivalent circuit model; Circuit testing; Equivalent circuits; FETs; Gallium arsenide; Intermodulation distortion; Phase shifters; Predictive models; Radio frequency; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 1993., IEEE MTT-S International
  • Conference_Location
    Atlanta, GA, USA
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-1209-0
  • Type

    conf

  • DOI
    10.1109/MWSYM.1993.276988
  • Filename
    276988