DocumentCode
1680746
Title
Infrared automatic mass screening (IRAMS): an ATE solution
Author
Chandler, Thomas L. ; Fredrickson, Cynthia A.
Author_Institution
Div. of Adv. Technol., Sacramento Army Depot, CA, USA
fYear
1988
Firstpage
55
Lastpage
57
Abstract
A method of board test which implements infrared automated mass screening (IRAMS) is proposed. This technique bypasses the diagnostics portion of the repair cycle and using IRAMS to quickly screen circuit board and perform fault detection. The go-chain is needed only as a quality inspection tool. Therefore, by eliminating diagnostics, IRAMS can greatly reduce the overall cost of developing and maintaining a test program set
Keywords
automatic test equipment; automatic testing; fault location; infrared imaging; military equipment; printed circuit testing; Air Force; Army; IR; PCB testing; cost; fault detection; infrared automated mass screening; military equipment ATE; quality inspection; repair depot; test program set; Automatic testing; Circuit faults; Circuit testing; Costs; Electrical fault detection; Electronic equipment testing; Fault detection; Infrared detectors; Printed circuits; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location
Minneapolis, MN
Type
conf
DOI
10.1109/AUTEST.1988.9585
Filename
9585
Link To Document