Title :
Two-tone measurement of the nonlinear behavior of a silicon-on-insulator (SOI) ring resonator
Author :
Spector, S.J. ; Yegnanarayanan, S. ; Swint, R.B. ; Lyszczarz, T.M. ; Juodawlkis, P.W.
Author_Institution :
Lincoln Lab., Massachusetts Inst. of Technol., Lexington, MA, USA
Abstract :
The nonlinearity of a SOI ring resonator was measured using a two-tone method. At frequencies near 10 MHz, 1.5 mW causes significant signal degradation. At frequencies near 1 GHz, little signal degradation is seen.
Keywords :
integrated optics; micro-optics; nonlinear optics; optical resonators; optical waveguides; silicon-on-insulator; Si; nonlinear behavior; power 1.5 mW; signal degradation; silicon-on-insulator ring resonator; two-tone measurement; Frequency measurement; Nonlinear optics; Optical attenuators; Optical distortion; Optical ring resonators; Radio frequency; Resonant frequency;
Conference_Titel :
Lasers and Electro-Optics (CLEO), 2012 Conference on
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4673-1839-6
