Title :
An experimental verification of thermal simulation by WATAND for a bipolar RF power transistor
Author :
Bryant, P.R. ; Roulston, D.J.
Author_Institution :
Dept. of Electr. Eng., Waterloo Univ., Ont., Canada
Abstract :
WATAND is the University of Waterloo´s interactive circuit simulation program for simulating the combined electrical and thermal behaviour of transistors. The authors report on a comparison between thermal mappings of bipolar RF power transistors obtained using WATAND simulation techniques on the one hand and using thermochromic liquid-crystal experimental techniques on the other. This comparison was carried out to test the accuracy of the WATAND modelling and simulation methods prior to using the simulation tool as a design aid in developing some ballasted RF devices.<>
Keywords :
bipolar transistors; digital simulation; power transistors; thermo-optical effects; WATAND; ballasted RF devices; bipolar RF power transistor; design aid; interactive circuit simulation program; simulation tool; thermal mappings; thermal simulation; thermochromic liquid-crystal experimental techniques; Analytical models; Circuit simulation; Computational modeling; Electronic ballasts; Power transistors; Radio frequency; Resistors; Semiconductor materials; Temperature; Thermochromism;
Conference_Titel :
Circuits and Systems, 1988., IEEE International Symposium on
Conference_Location :
Espoo, Finland
DOI :
10.1109/ISCAS.1988.14948
